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» On Modeling Cross-Talk Faults
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DATE
2007
IEEE
155views Hardware» more  DATE 2007»
14 years 3 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
AMCS
2008
146views Mathematics» more  AMCS 2008»
13 years 8 months ago
Fault Detection and Isolation with Robust Principal Component Analysis
Principal component analysis (PCA) is a powerful fault detection and isolation method. However, the classical PCA which is based on the estimation of the sample mean and covariance...
Yvon Tharrault, Gilles Mourot, José Ragot, ...
DDECS
2009
IEEE
149views Hardware» more  DDECS 2009»
14 years 17 days ago
Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
Yiorgos Sfikas, Yiorgos Tsiatouhas
ACISICIS
2008
IEEE
14 years 3 months ago
Designing Fault Tolerant Web Services Using BPEL
The web services technology provides an approach for developing distributed applications by using simple and well defined interfaces. Due to the flexibility of this architecture, ...
Jim Lau, Lau Cheuk Lung, Joni da Silva Fraga, Giul...