1187 search results - page 73 / 238 » On Modeling Cross-Talk Faults |
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
FMSP
2000
ACM
14 years 1 months ago
2000
ACM
When a program P fails to satisfy a requirement R supposedly ensured by a detailed speci cation S that was used to implement P, there is a question about whether the problem arise...
DATE
1999
IEEE
14 years 1 months ago
1999
IEEE
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
DATE
1999
IEEE
14 years 1 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
DDECS
2007
IEEE
14 years 3 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...