Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
Wangqi Qiu, Xiang Lu, Zhuo Li, D. M. H. Walker, We...
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
In this paper faults are processed and models of faults in telecommunications networks are proposed in relation to services and revenues. The probability of faults occurring is es...
Okuthe P. Kogeda, Johnson I. Agbinya, Christian W....