980 search results - page 65 / 196 » On Negative Bases |
ISQED
2010
IEEE
14 years 4 months ago
2010
IEEE
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...
TEI
2010
ACM
14 years 4 months ago
2010
ACM
In current healthcare research, pain logs are an important means to measure the impact of medication and to detect pain patterns. However, the entry of textual pain data may be ne...
ISQED
2009
IEEE
14 years 4 months ago
2009
IEEE
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
ICLP
2009
Springer
14 years 4 months ago
2009
Springer
The seemingly simple choice of whether to use call variance or call subsumption in a tabled evaluation deeply affects an evaluation’s properties. Most tabling implementations hav...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...