867 search results - page 117 / 174 » On Optimization of Test Parallelization with Constraints |
DAC
2010
ACM
14 years 9 days ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
ICPP
2005
IEEE
14 years 2 months ago
2005
IEEE
In this paper we introduce a new algorithm for computing near optimal schedules for task graph problems. In contrast to conventional approaches for solving those scheduling proble...
IEEEPACT
2008
IEEE
14 years 3 months ago
2008
IEEE
The emergence of power as a first-class design constraint has fueled the proposal of a growing number of run-time power optimizations. Many of these optimizations trade-off power...
TCAD
2008
13 years 9 months ago
2008
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
ACL
2010
13 years 7 months ago
2010
This paper describes a series of experiments to test the hypothesis that the parallel application of multiple NLP tools and the integration of their results improves the correctne...