60 search results - page 9 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...
MICRO
2006
IEEE
13 years 7 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
ICCAD
1992
IEEE
13 years 11 months ago
1992
IEEE
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...