We propose a new VLSI layout methodology which addresses the main problems faced in Deep Sub-Micron (DSM) integrated circuit design. Our layout "fabric" scheme eliminate...
Sunil P. Khatri, Amit Mehrotra, Robert K. Brayton,...
Due to larger buses (length, width) and deep sub-micron effects where coupling capacitances between bus lines are in the same order of magnitude as base capacitances, power consum...
VLSI engineers have traditionally used a variety of CAD analysis tools (e.g. SPICE) to deal with variability. As we go into deep sub micron issues, the analysis is becoming harder...
Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, De...