1529 search results - page 102 / 306 » On Timing Analysis of Combinational Circuits |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Statistical timing analysis needs a priori knowledge of process variations. Lack of such a priori knowledge of process variations prevents accurate statistical timing analysis, fo...
ECCC
2011
13 years 3 months ago
2011
Polynomial identity testing (PIT) problem is known to be challenging even for constant depth arithmetic circuits. In this work, we study the complexity of two special but natural ...
CODES
2002
IEEE
14 years 1 months ago
2002
IEEE
In this paper we present a method to perform static timing analysis of SystemC models, that describe parallel, communicating software processes.The paper combines a worstcase exec...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...
ISQED
2010
IEEE
14 years 3 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...