1529 search results - page 109 / 306 » On Timing Analysis of Combinational Circuits |
ISQED
2007
IEEE
14 years 2 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
VLSID
2009
IEEE
14 years 9 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
We propose the notion of logical reliability for real-time program tasks that interact through periodically updated program variables. We describe a reliability analysis that chec...
DAC
2000
ACM
14 years 21 days ago
2000
ACM
The decrease in feature size and added chip functionality in large sub-micron integrated circuits demand larger grids for power distribution. Since power grids are performance lim...
ASPDAC
2005
ACM
13 years 10 months ago
2005
ACM
Abstract— Frequency dependent interconnect analysis is challenging since lumped equivalent circuit models extracted at different frequencies exhibit distinct time and frequency d...