1529 search results - page 114 / 306 » On Timing Analysis of Combinational Circuits |
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper introduces a method and tool-support for the automatic analysis and verification of hybrid and embedded control systems, whose continuous dynamics are often modelled u...
VTS
2000
IEEE
14 years 21 days ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
In this paper, a Triangularization Based Structure preserving (TBS) model order reduction is proposed to verify power integrity of on-chip structured power grid. The power grid is...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
Predictive delay analysis is presented for a representative CMOS inverter with submicron device size using PREDICTMOS MOSFET model. As against SPICE, which adopts a time consuming...
PIMRC
2008
IEEE
14 years 2 months ago
2008
IEEE
— Noisy radio frequency (RF) circuits tend to degrade the system performance, especially in high frequency communication systems. The performance analysis of such systems is norm...