1444 search results - page 139 / 289 » On Variations of Power Iteration |
VLSID
1996
IEEE
14 years 12 days ago
1996
IEEE
The technique of mirror biasing is introduced and applied to a very high gain two stage CMOS cascode op-amp, in order to desensitize its output voltage to bias variations. Various...
ICCV
2007
IEEE
14 years 10 months ago
2007
IEEE
We propose using the proximity distribution of vectorquantized local feature descriptors for object and category recognition. To this end, we introduce a novel "proximity dis...
ICML
2008
IEEE
14 years 9 months ago
2008
IEEE
Previous algorithms for learning lexicographic preference models (LPMs) produce a "best guess" LPM that is consistent with the observations. Our approach is more democra...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
One of the main challenges for design in the presence of process variations is to cope with the uncertainties in delay and leakage power. In this paper, the influence of leakage r...
ICCD
2005
IEEE
14 years 5 months ago
2005
IEEE
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for VLSI design. This paper,...