1444 search results - page 181 / 289 » On Variations of Power Iteration |
DAC
2004
ACM
14 years 9 months ago
2004
ACM
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
MICCAI
2003
Springer
14 years 9 months ago
2003
Springer
Computer-aided diagnosis is often based on comparing a structure of interest with prior models. Such a comparison requires automatic techniques in determining prior models from a s...
ICML
2009
IEEE
14 years 9 months ago
2009
IEEE
This paper gives an efficient Bayesian method for inferring the parameters of a PlackettLuce ranking model. Such models are parameterised distributions over rankings of a finite s...
CEC
2009
IEEE
14 years 2 months ago
2009
IEEE
— In a real-world, labor market consist of employer and employee, and these individuals form relationship through mutual interactions. This paper mainly focuses on development of...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
NBTI (Negative Bias Temperature Instability) has emerged as the dominant PMOS device failure mechanism for sub100nm VLSI designs. There is little research to quantify its impact o...