1444 search results - page 8 / 289 » On Variations of Power Iteration |
DAC
2007
ACM
14 years 10 months ago
2007
ACM
This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...
ISVLSI
2008
IEEE
14 years 3 months ago
2008
IEEE
The share of leakage in cache power consumption increases with technology scaling. Choosing a higher threshold voltage (Vth) and/or gate-oxide thickness (Tox) for cache transistor...
ISQED
2009
IEEE
14 years 3 months ago
2009
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...
SOCC
2008
IEEE
14 years 3 months ago
2008
IEEE
— Several design metrics have been used in the past to evaluate the SRAM cell stability. However, most of them fail to provide the exact stability figures as shown in this paper...
TVLSI
2008
13 years 9 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...