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» On modeling top-down VLSI design
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GLVLSI
2005
IEEE
85views VLSI» more  GLVLSI 2005»
14 years 1 months ago
Utilizing don't care states in SAT-based bounded sequential problems
Boolean Satisfiability (SAT) solvers are popular engines used throughout the verification world. Bounded sequential problems such as bounded model checking and bounded sequentia...
Sean Safarpour, Görschwin Fey, Andreas G. Ven...
ISQED
2007
IEEE
160views Hardware» more  ISQED 2007»
14 years 1 months ago
On-Chip Inductance in X Architecture Enabled Design
The inductance effects become significant for sub-100nm process designs due to increasing interconnect lengths, lower interconnect resistance values and fast signal transition tim...
Santosh Shah, Arani Sinha, Li Song, Narain D. Aror...
VLSID
2002
IEEE
160views VLSI» more  VLSID 2002»
14 years 7 months ago
PREDICTMOS MOSFET Model and its Application to Submicron CMOS Inverter Delay Analysis
Predictive delay analysis is presented for a representative CMOS inverter with submicron device size using PREDICTMOS MOSFET model. As against SPICE, which adopts a time consuming...
A. B. Bhattacharyya, Shrutin Ulman
ISPD
2003
ACM
110views Hardware» more  ISPD 2003»
14 years 23 days ago
Explicit gate delay model for timing evaluation
Delay evaluation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. To obtain an accurate delay va...
Muzhou Shao, Martin D. F. Wong, Huijing Cao, Youxi...
GLVLSI
2008
IEEE
129views VLSI» more  GLVLSI 2008»
14 years 1 months ago
Variational capacitance modeling using orthogonal polynomial method
In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spect...
Jian Cui, Gengsheng Chen, Ruijing Shen, Sheldon X....