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» On multi-avoidance of generalized patterns
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DAC
2003
ACM
14 years 10 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
DAC
2006
ACM
14 years 10 months ago
High-level power management of embedded systems with application-specific energy cost functions
Most existing dynamic voltage scaling (DVS) schemes for multiple tasks assume an energy cost function (energy consumption versus execution time) that is independent of the task ch...
Youngjin Cho, Naehyuck Chang, Chaitali Chakrabarti...
DAC
2006
ACM
14 years 10 months ago
MARS-C: modeling and reduction of soft errors in combinational circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Natasa Miskov-Zivanov, Diana Marculescu
DAC
2006
ACM
14 years 10 months ago
Prediction-based flow control for network-on-chip traffic
Networks-on-Chip (NoC) architectures provide a scalable solution to on-chip communication problem but the bandwidth offered by NoCs can be utilized efficiently only in presence of...
Ümit Y. Ogras, Radu Marculescu
SIGSOFT
2008
ACM
14 years 9 months ago
The implications of method placement on API learnability
To better understand what makes Application Programming Interfaces (APIs) hard to use and how to improve them, recent research has begun studying programmers' strategies and ...
Jeffrey Stylos, Brad A. Myers