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149
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ISAAC
2009
Springer
16 years 21 days ago
2009
Springer
The faulty memory RAM presented by Finocchi and Italiano [1] is a variant of the RAM model where the content of any memory cell can get corrupted at any time, and corrupted cells c...
149
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IWANN
2009
Springer
16 years 21 days ago
2009
Springer
We study the dynamics of a simple bistable system driven by multiplicative correlated noise. Such system mimics the dynamics of classical attractor neural networks with an addition...
144
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ASPDAC
2009
ACM
16 years 20 days ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...
126
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CDC
2008
IEEE
16 years 19 days ago
2008
IEEE
— Consider a discrete-time networked control scheme, in which the controller has direct access to noisy measurements of the plant’s output, but the controller and the actuator ...
114
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COMSWARE
2008
IEEE
16 years 19 days ago
2008
IEEE