166 search results - page 9 / 34 » On testing delay faults in macro-based combinational circuit... |
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ITC
1993
IEEE
13 years 12 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
ITC
1999
IEEE
14 years 1 days ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
DAC
2005
ACM
13 years 9 months ago
2005
ACM
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...