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27

DATE
2003
IEEE

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Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG

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Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG

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Hideyuki Ichihara, Tomoo Inoue

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	DATE
Authors	Hideyuki Ichihara, Tomoo Inoue

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