418 search results - page 18 / 84 » On the Adders with Minimum Tests |
DAC
2004
ACM
13 years 11 months ago
2004
ACM
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
ENGL
2007
13 years 7 months ago
2007
— Power consumption has become a crucial concern in Built In Self Test (BIST) due to the switching activity in the circuit under test(CUT). In this paper we present a novel metho...
ICCAD
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
ICST
2008
IEEE
14 years 2 months ago
2008
IEEE
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
IPPS
1998
IEEE
13 years 12 months ago
1998
IEEE
We propose a periodic diagnostic algorithm based on the testing model of computation for real-time systems. The diagnostic task runs on every processor of the system. When the task...