1795 search results - page 122 / 359 » On the Complexity of Circuit Satisfiability |
VTS
2007
IEEE
14 years 3 months ago
2007
IEEE
—As the complexity of the integrated circuits increases, they become more susceptible to manufacturing faults, decreasing the total process yield. Thus, it would be desirable to ...
ACSD
2005
IEEE
14 years 2 months ago
2005
IEEE
Register Transfer Level (RTL) synthesis model which simplified the design of clocked circuits allowed design automation boost and VLSI progress for more than a decade. Shrinking t...
ISPD
2004
ACM
14 years 2 months ago
2004
ACM
High performance integrated circuits are now reaching the 100-plus watt regime, and power delivery and power grid signal integrity have become critical. Analyzing the performance ...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...