1795 search results - page 171 / 359 » On the Complexity of Circuit Satisfiability |
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
GLVLSI
2007
IEEE
14 years 3 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
GLVLSI
2006
IEEE
14 years 3 months ago
2006
IEEE
In modern IC design, the number of long on-chip wires has been growing rapidly because of the increasing circuit complexity. Interconnect delay has dominated over gate delay as te...
ISLPED
2006
ACM
14 years 3 months ago
2006
ACM
—The thermal gradients existing in high-performance circuits may significantly affect their timing behavior, in particular, by increasing the skew of the clock net and/or alteri...
ISPD
2006
ACM
14 years 3 months ago
2006
ACM
The integration of retiming and simultaneous supply/threshold voltage scaling has a potential to enable more rigorous total power reduction. However, such integration is a highly ...