1795 search results - page 45 / 359 » On the Complexity of Circuit Satisfiability |
TIT
2008
13 years 8 months ago
2008
The term binary combinatorial Gray code refers to a list of binary words such that the Hamming distance between two neighboring words is one and the list satisfies some additional ...
ITC
1998
IEEE
14 years 28 days ago
1998
IEEE
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
Interconnect with an insufficient width may be subject to electromigration and eventually cause the failure of the circuit at any time during its lifetime. This problem has gotten...
ITC
1994
IEEE
14 years 24 days ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
TCAD
2002
13 years 8 months ago
2002
We develop a general methodology to analyze crosstalk effects that are likely to cause errors in deep submicron high speed circuits. We focus on crosstalk due to capacitive coupli...