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» On the Complexity of Circuit Satisfiability
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ASPDAC
2006
ACM
144views Hardware» more  ASPDAC 2006»
14 years 2 months ago
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahas...
ATS
2000
IEEE
134views Hardware» more  ATS 2000»
14 years 1 months ago
Fsimac: a fault simulator for asynchronous sequential circuits
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
Susmita Sur-Kolay, Marly Roncken, Ken S. Stevens, ...
ICCAD
2000
IEEE
100views Hardware» more  ICCAD 2000»
14 years 1 months ago
Partial Simulation-Driven ATPG for Detection and Diagnosis of Faults in Analog Circuits
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
Sudip Chakrabarti, Abhijit Chatterjee
ASPDAC
1999
ACM
113views Hardware» more  ASPDAC 1999»
14 years 1 months ago
An Efficient Iterative Improvement Technique for VLSI Circuit Partitioning Using Hybrid Bucket Structures
In this paper, we present a fast and efficient Iterative Improvement Partitioning (IIP) technique for VLSI circuits and hybrid bucket structures on its implementation. Due to thei...
C. K. Eem, J. W. Chong
CHARME
1995
Springer
120views Hardware» more  CHARME 1995»
14 years 11 days ago
Timing analysis of asynchronous circuits using timed automata
In this paper we present a method formodeling asynchronous digital circuits by timed automata. The constructed timed automata serve as \mechanical" and veri able objects for a...
Oded Maler, Amir Pnueli