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IEEEPACT
2006
IEEE
14 years 2 months ago
2006
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
ISCAS
2006
IEEE
14 years 2 months ago
2006
IEEE
Abstract—We present a silicon neuron with a dynamic, active leak that enables precise spike-timing with respect to a time-varying input signal. Our neuron models the mammalian bu...
SMI
2006
IEEE
14 years 2 months ago
2006
IEEE
The description of 3D shapes with features that possess descriptive power and invariant under similarity transformations is one of the most challenging issues in content based 3D ...
VLSID
2006
IEEE
14 years 2 months ago
2006
IEEE
As the IC process technology scales, the oxide thickness and operating voltage continues to decrease. The gate oxide thickness in recent and future IC process technology has appro...
VLSID
2006
IEEE
14 years 2 months ago
2006
IEEE
This tutorial focuses on advanced techniques to cope with the complexity of designing modern digital chips which are complete systems often containing multiple processors, complex...