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VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
14 years 8 months ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
FUZZIEEE
2007
IEEE
14 years 2 months ago
Distance Measure Assisted Rough Set Feature Selection
Abstract— Feature Selection (FS) is a technique for dimensionality reduction. Its aims are to select a subset of the original features of a dataset which are rich in the most use...
Neil MacParthalain, Qiang Shen, Richard Jensen
WSC
2007
13 years 10 months ago
Path-sampling for state-dependent importance sampling
State-dependent importance sampling (SDIS) has proved to be particularly useful in simulation (specially in rare event analysis of stochastic systems). One approach for designing ...
Jose H. Blanchet, Jingchen Liu
MICRO
2006
IEEE
127views Hardware» more  MICRO 2006»
14 years 1 months ago
A Predictive Performance Model for Superscalar Processors
Designing and optimizing high performance microprocessors is an increasingly difficult task due to the size and complexity of the processor design space, high cost of detailed si...
P. J. Joseph, Kapil Vaswani, Matthew J. Thazhuthav...
DSRT
2008
IEEE
14 years 2 months ago
Observability Checking to Enhance Diagnosis of Real Time Electronic Systems
This paper describes a new property checking approach in order to enhance the diagnosis ability of an electronic embedded system, included in an automotive application. We conside...
Manel Khlif, Mohamed Shawky