We describe an approach based upon software process technology to on-the-fly monitoring, redeployment, reconfiguration, and in general dynamic adaptation of distributed software ap...
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis...
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
This paper presents a dependability oriented, fault tolerance based system design, development, and deployment approach. The approach relies on an architectural framework, which a...
Domenico Cotroneo, Nicola Mazzocca, Luigi Romano, ...