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EWSPT
2001
Springer
14 years 1 months ago
2001
Springer
We describe an approach based upon software process technology to on-the-fly monitoring, redeployment, reconfiguration, and in general dynamic adaptation of distributed software ap...
IOLTS
2008
IEEE
14 years 3 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
DATE
1998
IEEE
14 years 1 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
VTS
1997
IEEE
14 years 1 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
JSA
2002
13 years 8 months ago
2002
This paper presents a dependability oriented, fault tolerance based system design, development, and deployment approach. The approach relies on an architectural framework, which a...