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EMSOFT
2005
Springer
14 years 1 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
FOSSACS
2005
Springer
14 years 1 months ago
Branching Cells as Local States for Event Structures and Nets: Probabilistic Applications
We study the concept of choice for true concurrency models such as prime event structures and safe Petri nets. We propose a dynamic variation of the notion of cluster previously in...
Samy Abbes, Albert Benveniste
ISLPED
2004
ACM
139views Hardware» more  ISLPED 2004»
14 years 1 months ago
Eliminating voltage emergencies via microarchitectural voltage control feedback and dynamic optimization
Microprocessor designers use techniques such as clock gating to reduce power dissipation. An unfortunate side-effect of these techniques is the processor current fluctuations th...
Kim M. Hazelwood, David Brooks
CLOUD
2010
ACM
14 years 21 days ago
RACS: a case for cloud storage diversity
The increasing popularity of cloud storage is leading organizations to consider moving data out of their own data centers and into the cloud. However, success for cloud storage pr...
Hussam Abu-Libdeh, Lonnie Princehouse, Hakim Weath...
LCTRTS
2010
Springer
14 years 12 days ago
Cache vulnerability equations for protecting data in embedded processor caches from soft errors
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
Aviral Shrivastava, Jongeun Lee, Reiley Jeyapaul