372 search results - page 17 / 75 » On the Fault Testing for Reversible Circuits |
DAC
1994
ACM
14 years 21 days ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
VTS
1996
IEEE
14 years 22 days ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
ICCAD
1997
IEEE
14 years 24 days ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
IOLTS
2006
IEEE
14 years 2 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
VTS
1996
IEEE
14 years 22 days ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...