372 search results - page 27 / 75 » On the Fault Testing for Reversible Circuits |
DSD
2010
IEEE
13 years 7 months ago
2010
IEEE
— A method how to improve the coverage of single faults in combinational circuits is proposed. The method is based on Concurrent Error Detection, but uses a fault simulation to f...
ICES
2000
Springer
14 years 6 days ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
AICCSA
2006
IEEE
13 years 10 months ago
2006
IEEE
To excite a stuck-open fault in a CMOS combinational circuit, it is only necessary that the output of the gate containing the fault takes on opposite values during the application...
DATE
1999
IEEE
14 years 28 days ago
1999
IEEE
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
DATE
1998
IEEE
14 years 27 days ago
1998
IEEE
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...