372 search results - page 41 / 75 » On the Fault Testing for Reversible Circuits |
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
INFSOF
2006
13 years 7 months ago
2006
In finite state machine (FSM) based testing, the problem of fault masking in the unique input/output (UIO) sequence may degrade the test performance of the UIO based methods. This...
VTS
2003
IEEE
14 years 25 days ago
2003
IEEE
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
VTS
1999
IEEE
13 years 11 months ago
1999
IEEE
A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect p...