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DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
PPOPP
1993
ACM
13 years 11 months ago
1993
ACM
This paper discusses some of the issues involved in implementing a shared-address space programming model on large-scale, distributed-memory multiprocessors. While such a programm...
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
DAC
2011
ACM
12 years 7 months ago
2011
ACM
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Extending 2-D planar topologies in integrated circuits (ICs) to a 3-D implementation has the obvious benefits of reducing the overall footprint and average interconnection length,...