9949 search results - page 1916 / 1990 » On the Network Complexity of Selection |
ICCAD
2009
IEEE
13 years 6 months ago
2009
IEEE
Heat removal and power delivery have become two major reliability concerns in 3D stacked IC technology. For thermal problem, two possible solutions exist: thermal-through-silicon-...
WWW
2011
ACM
13 years 3 months ago
2011
ACM
In this paper, we study the problem of transfer learning from text to images in the context of network data in which link based bridges are available to transfer the knowledge bet...
CORR
2011
Springer
13 years 17 days ago
2011
Springer
Despite recent advances in uncovering the quantitative features of stationary human activity patterns, many applications, from pandemic prediction to emergency response, require a...
DAC
2011
ACM
12 years 8 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
HOTI
2011
IEEE
12 years 8 months ago
2011
IEEE
Abstract—Network-on-Chips (NoCs) paradigm is fast becoming a defacto standard for designing communication infrastructure for multicores with the dual goals of reducing power cons...