27 search results - page 2 / 6 » On the Size and Generation of Minimal N-Detection Tests |
ICDE
2011
IEEE
12 years 11 months ago
2011
IEEE
—Complex SQL queries are widely used today, but it is rather difficult to check if a complex query has been written correctly. Formal verification based on comparing a specifi...
ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
DATE
2002
IEEE
14 years 12 days ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
CAP
2010
13 years 2 months ago
2010
Computing the minimal elements of a partially ordered finite set (poset) is a fundamental problem in combinatorics with numerous applications such as polynomial expression optimiz...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compat...