44 search results - page 5 / 9 » On the role of timing masking in reliable logic circuit desi... |
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
GLVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
Statistical static timing analysis (SSTA) plays a key role in determining performance of the VLSI circuits implemented in state-of-the-art CMOS technology. A pre-requisite for emp...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
An effective method for focusing optimization effort on the most important parts of a design is to examine those elements on the critical path. Traditionally, the critical path is...
ICCAD
1998
IEEE
13 years 11 months ago
1998
IEEE
Noise can cause digital circuits to switch incorrectly and thus produce spurious results. Noise can also have adverse power, timing and reliability e ects. Dynamic logic is partic...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...