229 search results - page 13 / 46 » On-Chip Test Generation Using Linear Subspaces |
CVIU
2007
13 years 7 months ago
2007
The problem of face detection remains challenging because faces are non-rigid objects that have a high degree of variability with respect to head rotation, illumination, facial ex...
ISSRE
2000
IEEE
14 years 1 days ago
2000
IEEE
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
ICCD
2002
IEEE
14 years 4 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
ASPDAC
1998
ACM
13 years 12 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
ITSSA
2006
13 years 7 months ago
2006
: This article proposes a new method for creating test software for object-oriented systems using a genetic programming approach. It is believed that this approach is advantageous ...