229 search results - page 14 / 46 » On-Chip Test Generation Using Linear Subspaces |
MTDT
2000
IEEE
14 years 1 days ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
ICPR
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--Rough face alignments lead to suboptimal performance of face identification systems. In this study, we present a novel approach for identifying genders from facial images...
ISCAS
1999
IEEE
13 years 12 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
CGF
2008
13 years 7 months ago
2008
Many categories of objects, such as human faces, can be naturally viewed as a composition of several different layers. For example, a bearded face with glasses can be decomposed i...