67 search results - page 12 / 14 » Online circuit reliability monitoring |
NIPS
1997
13 years 11 months ago
1997
With the rapid expansion of computer networks during the past few years, security has become a crucial issue for modern computer systems. A good way to detect illegitimate use is ...
JCP
2006
13 years 9 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
ISLPED
2004
ACM
14 years 3 months ago
2004
ACM
We present a novel temperature/leakage sensor, developed for high-speed, low-power, monitoring of processors and complex VLSI chips. The innovative idea is the use of 4T SRAM cell...
ICISC
2009
13 years 7 months ago
2009
Abstract. Automatic recognition of human faces is becoming increasingly popular in civilian and law enforcement applications that require reliable recognition of humans. However, t...
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...