67 search results - page 7 / 14 » Online circuit reliability monitoring |
IOLTS
2006
IEEE
14 years 3 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
RTAS
2007
IEEE
14 years 4 months ago
2007
IEEE
The prominent energy management technique in real-time embedded systems, Dynamic Voltage and Frequency Scaling (DVFS), was recently shown to have direct and adverse effects on sys...
IOLTS
2008
IEEE
14 years 4 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
DAC
2009
ACM
14 years 10 months ago
2009
ACM
Post-silicon processor debugging is frequently carried out in a loop consisting of several iterations of the following two key steps: (i) processor execution for some duration, fo...
SIGCOMM
2010
ACM
13 years 10 months ago
2010
ACM
The user experience for networked applications is becoming a key benchmark for customers and network providers. Perceived user experience is largely determined by the frequency, d...