In order to cope with the ever increasing complexity of todays application specific integrated circuits, a building block based design methodology is established. The system is co...
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
For call intensive programs, function calls are major bottlenecks during program execution since they usually force register contents to be spilled into memory. Such register to m...
Manoranjan Satpathy, Rabi N. Mahapatra, Siddharth ...
Extensible processors allow addition of application-specific custom instructions to the core instruction set architecture. These custom instructions are selected through an analys...
Double Patterning Lithography (DPL) is one of the few hopeful candidate solutions for the lithography for CMOS process beyond 45nm. DPL assigns the patterns less than a certain di...