43 search results - page 9 / 9 » Optimal Supply and Threshold Scaling for Subthreshold CMOS C... |
VLSID
2002
IEEE
14 years 11 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
CASES
2006
ACM
14 years 4 months ago
2006
ACM
Rising interest in the applications of wireless sensor networks has spurred research in the development of computing systems for lowthroughput, energy-constrained applications. Un...