9 search results - page 2 / 2 » Optimized self-tuning for circuit aging |
150
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ISQED
2010
IEEE
16 years 16 days ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...
151
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DATE
2009
IEEE
16 years 12 days ago
2009
IEEE
Abstract—Reliable and verifiable hardware, software and content usage metering (HSCM) are of primary importance for wide segments of e-commerce including intellectual property a...
162
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ICVS
2001
Springer
15 years 10 months ago
2001
Springer
Abstract. At the first ICVS, we presented SA-C (“sassy”), a singleassignment variant of the C programming language designed to exploit both coarse-grain and fine-grain parallel...
138
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DATE
2009
IEEE
16 years 12 days ago
2009
IEEE
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...