1063 search results - page 64 / 213 » Order and Negation as Failure |
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
ECML
2004
Springer
14 years 3 months ago
2004
Springer
Support Vector Machines (SVM) have been extensively studied and have shown remarkable success in many applications. However the success of SVM is very limited when it is applied to...
IUI
2003
ACM
14 years 3 months ago
2003
ACM
Guidebots, or animated pedagogical agents, can enhance interactive learning environments by promoting deeper learning and improve the learner's subjective experience. Guidebo...
DATE
2010
IEEE
14 years 3 months ago
2010
IEEE
—Static and dynamic variations, which have negative impact on the reliability of microelectronic systems, increase with smaller CMOS technology. Thus, further downscaling is only...
ECBS
1999
IEEE
14 years 2 months ago
1999
IEEE
Researchers have defined a number of process modeling methods and have developed in-roads to process-centered environments that support process modeling and project control. Howev...