Bounded Model Checking (BMC) relies on solving a sequence of highly correlated Boolean satisfiability (SAT) problems, each of which corresponds to the existence of counter-example...
Chao Wang, HoonSang Jin, Gary D. Hachtel, Fabio So...
Industrial databases often contain a large amount of unfilled information. During the knowledge discovery process one processing step is often necessary in order to remove these ...
The Automated Multiple View Inspection (AMVI) has been recently developed for automated defect detection of manufactured objects. The approach detects defects by analysing image se...
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
Utilizing the nonuniform latencies of SDRAM devices, access reordering mechanisms alter the sequence of main memory access streams to reduce the observed access latency. Using a r...