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3DPVT
2006
IEEE
195views Visualization» more  3DPVT 2006»
14 years 1 months ago
The ASDMCon Project: The Challenge of Detecting Defects on Construction Sites
Techniques for three dimensional (3D) imaging and analysis of as-built conditions of buildings are gaining acceptance in the Architecture, Engineering, and Construction (AEC) comm...
Kui Yue, Daniel Huber, Burcu Akinci, Ramesh Krishn...
CW
2006
IEEE
14 years 1 months ago
Standardized Virtual Reality, Are We There Yet?
Despite its history of several decades and impressive achievements, developing a VR application is still a complex task. Setting-up a Virtual Environment requires choosing a suita...
Mario A. Gutierrez A., Frédéric Vexo...
DATE
2006
IEEE
91views Hardware» more  DATE 2006»
14 years 1 months ago
On-chip 8GHz non-periodic high-swing noise detector
In this paper we present an overview of an on-chip noise detection circuit. Mainly, this work is different form the previous works concerning on-chip noise measurement in one or m...
Mohamed Abbas, Makoto Ikeda, Kunihiro Asada
DATE
2006
IEEE
91views Hardware» more  DATE 2006»
14 years 1 months ago
Virtual prototyping of embedded platforms for wireless and multimedia
Most of the challenges related to the development of multi-processor platforms for complex wireless and multimedia applications fall into the Electronic System Level (ESL) domain....
Tim Kogel, Matthew Braun
HICSS
2006
IEEE
131views Biometrics» more  HICSS 2006»
14 years 1 months ago
Understanding Patterns of Technology Evolution: An Ecosystem Perspective
Understanding the dynamics of technology evolution—whether for the purposes of forecasting new product or technology infrastructure developments, or identifying the basis for fu...
Gediminas Adomavicius, Jesse Bockstedt, Alok Gupta...