The unique and unpredictable nature of silicon enables the use of physical unclonable functions (PUFs) for chip identification and authentication. Since the function of PUFs depen...
Lang Lin, Daniel E. Holcomb, Dilip Kumar Krishnapp...
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
Interconnection networks have been deployed as the communication fabric in a wide range of parallel computer systems. With recent technological trends allowing growing quantities ...
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...