In this paper, we describe a low power and high speed multiplier suitable for standard cell-based ASIC design methodologies. For the purpose, an optimized booth encoder, compact 2...
Ki-seon Cho, Jong-on Park, Jin-seok Hong, Goang-se...
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
Sayeed A. Badrudduza, Ziyan Wang, Giby Samson, Law...
In this paper, we observe that minimum energy Emin of subthreshold logic dramatically increases when reaching 45 nm node. We demonstrate by circuit simulation and analytical model...
David Bol, Dina Kamel, Denis Flandre, Jean-Didier ...
duce system weight and volume, increase operating lifetime, The recent explosion in capability of embedded and portable decrease maintenance costs, and open new frontiers for inele...
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...