1834 search results - page 226 / 367 » PICTURE - A new Approach for Domain-Specific Process Modelli... |
CVPR
2009
IEEE
15 years 1 months ago
2009
IEEE
We propose a novel tracking algorithm for the target of which geometric appearance changes drastically over time. To track it, we present a local patch-based appearance model and p...
DATE
2010
IEEE
13 years 7 months ago
2010
IEEE
—Model-Based Development (MBD) provides an al level of abstraction, the model, which lets engineers focus on the business aspect of the developed system. MBD permits automatic tr...
CVPR
1998
IEEE
14 years 11 months ago
1998
IEEE
In this paper we present a method for the integration of nonlinear holonomic constraints in deformable models and its application to the problems of shape and illuminant direction...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
ICANN
2005
Springer
14 years 2 months ago
2005
Springer
One aim of Meta-learning techniques is to minimize the time needed for problem solving, and the effort of parameter hand-tuning, by automating algorithm selection. The predictive m...