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» Packet-Based Input Test Data Compression Techniques
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VTS
2003
IEEE
119views Hardware» more  VTS 2003»
14 years 18 days ago
Test Data Compression Using Dictionaries with Fixed-Length Indices
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
Lei Li, Krishnendu Chakrabarty
DATE
2005
IEEE
172views Hardware» more  DATE 2005»
14 years 29 days ago
Evolutionary Optimization in Code-Based Test Compression
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
Ilia Polian, Alejandro Czutro, Bernd Becker
ISSTA
2004
ACM
14 years 23 days ago
Test input generation with java PathFinder
We show how model checking and symbolic execution can be used to generate test inputs to achieve structural coverage of code that manipulates complex data structures. We focus on ...
Willem Visser, Corina S. Pasareanu, Sarfraz Khursh...
ITC
2003
IEEE
139views Hardware» more  ITC 2003»
14 years 18 days ago
A Hybrid Coding Strategy For Optimized Test Data Compression
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that runlength c...
Armin Würtenberger, Christofer S. Tautermann,...
ET
2002
72views more  ET 2002»
13 years 7 months ago
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...
Abhijit Jas, Nur A. Touba