257 search results - page 7 / 52 » Packet-Based Input Test Data Compression Techniques |
HPDC
2010
IEEE
13 years 8 months ago
2010
IEEE
The Semantic Web consists of many billions of statements made of terms that are either URIs or literals. Since these terms usually consist of long sequences of characters, an effe...
ITC
2003
IEEE
14 years 18 days ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
BNCOD
2003
13 years 8 months ago
2003
Evaluating a query can involve manipulation of large volumes of temporary data. When the volume of data becomes too great, activities such as joins and sorting must use disk, and ...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...