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» Packet-Based Input Test Data Compression Techniques
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KBSE
1997
IEEE
13 years 11 months ago
Genetic Algorithms for Dynamic Test Data Generation
In software testing, it is often desirable to find test inputs that exercise specific program features. To find these inputs by hand is extremely time-consuming, especially whe...
Christoph C. Michael, Gary McGraw, Michael Schatz,...
VTS
2006
IEEE
116views Hardware» more  VTS 2006»
14 years 1 months ago
Combining Linear and Non-Linear Test Vector Compression Using Correlation-Based Rectangular Encoding
A technique is presented here for improving the compression achieved with any linear decompressor by adding a small non-linear decoder that exploits bit-wise and pattern-wise corr...
Jinkyu Lee, Nur A. Touba
ICCAD
2004
IEEE
101views Hardware» more  ICCAD 2004»
14 years 4 months ago
Frugal linear network-based test decompression for drastic test cost reductions
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
Wenjing Rao, Alex Orailoglu, G. Su
ICSE
2009
IEEE-ACM
14 years 2 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
Jacob Burnim, Sudeep Juvekar, Koushik Sen
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
13 years 11 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey